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1.1 This guide outlines the origins and manifestations of unwanted electron beam effects in Auger electron spectroscopy (AES).
Author | ASTM |
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Editor | ASTM |
Document type | Standard |
Format | File |
ICS | 17.180.30 : Optical measuring instruments
|
Number of pages | 5 |
Replace | ASTM E983-10(2018) + Redline |
Year | 2019 |
Document history | ASTM E983-10(2018) + Redline ASTM E983-10 + Redline ASTM E983-05 + Redline ASTM E983-94(1999) + Redline |
Country | USA |
Keyword | ASTM 983;ASTM E983;ASTM E983;10.1520/E0983-19 |