JIS C 5003:1974 (R2014)

This Japanese Industrial Standard is applicable to electronic components, hereinafter referred to as the 'components', to be produced continuously, under essentially the same design, and established quality control, on which a certain failure rate, during expected life time can generally be assumed; and specifies procedure for the initial judgement, maintenance, principle of expansion measuring interval, number of samples, test period, disposal of obtained results, etc. to determine failure rate level of the components in accordance with the single sampling inspection system by attributes.