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JIS H 0603:1978 (R2014)
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JIS H 0603:1978 (R2014)
Measurement of minority carrier life time in germanium by photoconductive decay methodMore info
This Japanese Industrial Standard specifies the method of minority carrier life time, hereinafter referred to as the 'life time', in germanium single crystal by photoconductive decay method. The single crystal to be measured has homogeneous composition and the value of its life time shall be within a range of 5 to 1000 muns.
| Author | JSA |
|---|---|
| Editor | JSA |
| Document type | Standard |
| Format | File |
| Confirmation date | 2014-10-20 |
| ICS | 29.045 : Semiconducting materials
77.120.99 : Other non-ferrous metals and their alloys |
| Number of pages | 4 |
| Year | 1970 |
| Document history | |
| Country | Japan |
| Keyword | JIS 0603;0603;JIS H 0603-1978 |